STRATEGIC TECHNOLOGY ANALYSIS
Gaussian Process replaces 30 years of institutional knowledge with 50 data-driven iterations. Ground truth from UCI SECOM (1,567 real wafers).
Poisson defect model: Y = e-DA. Smaller dies at mature nodes beat bleeding-edge monolithic.
Multi-objective scoring: Capability (40%) + Urgency (30%) + Risk (30%). Click targets to compare.
36-month simulation: Wright's learning curve yield + linear capacity ramp + stockpile buildup.